Special Issue

The 2018 IEEE International Conference on Imaging Systems and Techniques is the premier forum for the presentation of technological advances and research results and will take place jointly with the IEEE International School of Imaging in Kraków, Poland, 16–18 October 2018 http://ist2018.ieee-ims.org/.

Selected original and invited research works presented at the conference will be organized into this Special Issue of Sensors, “Selected Papers from the 2018 IEEE International Conference on Imaging Systems and Techniques (IST 2018)”.

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The Deadline for Submissions is April 30, 2019